SAI RAM'S INNOMATIONS INDIA PVT.LTD.

SRI-CSN

The SRI-CSN is an advanced 24-slot RFID inlay tester designed for pre-laminated and post-laminated contactless card production. Built for automated sheet-level chip and antenna validation, it enables manufacturers to detect defects early and eliminate costly production errors caused by mixed inlay inventories or improper lamination settings. Engineered for speed, accuracy, and repeatability, SRI-CSN ensures reliable testing of RFID inlays before cards reach final production stages.

Key Features

Simultaneous testing of 24 RFID inlays (3×8 format) for fast and efficient sheet-level validation.
Automated RFID inlay testing system for both pre-laminated and post-laminated contactless card production.
Supports MIFARE 1K, 4K, Ultralight, and DESFire chips from NXP, Fudan, and other manufacturers.
Advanced RFID read/write tester with auto and manual modes for bulk key updates and sector encryption.

Resources

Technical Specifications

Applications

Technical Specifications

Name	Specifications
Frequency	13.56 MHz (HF RFID)
Data Interface	USB 2.0
Baud Rate	38400 bps
Reading Distance	Up to 5 cm
Input Power	230–250V AC
Operating Temperature:	-10°C to +50°C

Applications

Card Manufacturers

The SRI-CSN enables precise RFID inlay testing for contactless card manufacturing, ensuring chip and antenna functionality before and after lamination. With 24-slot simultaneous testing and MIFARE/DESFire compatibility, it helps manufacturers reduce rejection rates, prevent mixed inlay errors, and maintain strict quality control standards.

OEMs (Original Equipment Manufacturers)

For OEMs producing RFID-enabled cards and modules, the SRI-CSN provides automated sheet-level RFID chip validation and encoding verification. Its read/write modes, sector encryption support, and multi-chip compatibility ensure consistent production output and reliable OEM-grade compliance testing.